Solid State Sciences @ UGent

XPS Surface Analysis Laboratory

Solid State Sciences LOGO
Restrictions on samples :  
Samples are solid/powder and must be vacuum compatible. A sample can range in size from 0.1 mm in diameter and very thin to 7 cm in diameter and 2 cm thick. Powdered and other rough surfaced samples can also be analyzed. 
Samples are generally mounted using clips or adhesives onto standard fixtures. It is useful to know in advance if the sample is conducting and if it will be outgassing in vacuum.
Please keep your samples clean (keep them in an sealed container or in Aluminium foil, do not touch them)

XPS VG S-probe 

VG XPS @ UGent X-ray photoelectron spectroscopy
S-Probe Monochromatized XPS spectrometer  Al(KR) radiation (1486 eV) as a probe,
Surface Science Instruments (VG)

Some Specific Capabilities.

Compositional Analysis: Atomic abundance of all elements (except H) on insulators, powders,metals, etc.
Chemical Analysis : Identifies bonds between specific atoms in the surface region. Polymers, oxides, etc. characterized.
Depth Profiles : Characterizes buried regions as they are exposed by ion etching.

Specifications

• Detection limits (all elements except H): ~ 0.01 monolayer, or ~ 0.1% bulk

• Measurement depth: 1 - 5 nm; area: 0.2 - 1 mm dia. (+ depth profiling with ion gun)

• Sample size: 0.1mm to 70mm dia. x 20 mm thick

• Spectrometer: Monochromatized Al(ka) Source; Vacuum ~ 5 x 10e(-10) mbar

XPS lab : 43.72
Nico De Roo : 43.69
Calendar of VG XPS
Website Department of Solid State Sciences