XPS Service Information (Solid State Sciences @ UGent)
Contact Nico De Roo for more information
Our XPS (X-ray Photoelectron Spectroscopy) service is available to both internal and external parties. We use the setup not only for our own research but also to perform analyses for companies and other institutions.
XPS is a powerful surface analysis technique that allows identification of the constituent elements within the top 5 to 10 nanometers of a sample. However, it is important to note the following:
- XPS is less suitable for detecting elements present in low concentrations (typically below 5%) in a quantitative manner.
- While XPS provides good quantitative data, it is not as strong in this regard as some other analytical techniques.
- The key strength of XPS lies in its ability to provide information about the chemical state of the elements.
- For example, it can distinguish between Ti₂O and TiO₂ based on the chemical state of titanium.
- This advantage comes with a trade-off: peak fitting and verification of binding energies are required, which can sometimes be complex and time-consuming.
- It is possible to analyze deeper layers of the sample using ion sputtering, though this process can alter the surface composition. We occasionally apply mild sputtering to remove surface contamination.
Sample Guidelines
To ensure accurate and efficient measurements, please consider the following:
1. Sample Requirements
- Samples must be vacuum compatible.
- Please inform us of any potential safety hazards in advance.
2. Sample Size
- Preferred dimensions: 1×1 cm to 4×4 cm. Larger samples may be possible upon request.(thickness up to 1cm (maybe more) preffered smaller)
- A size of around 1×1 cm and thickness of a few mm is ideal for batch measurements.
- Powders are typically pressed into pellets (~1 cm diameter, a few mm thick). If they break, additional powder may be needed.
3. Sample Information
- Please provide:
- A list of expected elements (to avoid spectral overlaps).
- The goal of the measurement (e.g., chemical composition, comparison between samples, etc.).
- XPS is especially effective when analyzing a series of samples with varying parameters.
Pricing Structure
Pricing depends on:
- Sample type and composition.
- Number of elements and measurement points.
- Number of samples per sample holder.
Basic Package
depends on samples and information needed but we can provide an test package at a fixed price
Includes:
- Wide scan (overview of present elements)
- Detailed scans of relevant elements
- Preliminary analysis (chemical composition and peak identification)
Additional Services
- Extra measurement points on the same sample(Standard: 1 point per sample, spot size ~1 × 1.5 mm)
- Extra elements.
- Full spectral evaluation and peak fitting: available at an additional cost
- Report by professor: available at an additional cost.
- If the analysis is required as part of an expert opinion for a liability dispute, it must be carried out by a Professor. This is not included in the standard service.
Timing
Normally the measurements can be carried out within 1-3 weeks after communication.
The normal package needs about 2-5 working days to be measured, can be slower depended on the samples.
Visit & Demonstration
You are welcome to visit us for a brief introduction to the XPS technique and a demonstration of the instrument.
Nico De Roo