Solid State Sciences @ UGent

XPS Surface Analysis Laboratory

X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect.
Elements on the surface (nm range 10-9 m) of a sample can be identified (elemental composition) also their chemical state and the overall electronic structure. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.

Restrictions on samples :
Samples are solid/powder and must be vacuum compatible. A sample can range in size from 0.1 mm in diameter and very thin to 7 cm in diameter and 2 cm thick. Powdered and other rough surfaced samples can also be analyzed.
Samples are generally mounted using clips or adhesives onto standard fixtures. It is useful to know in advance if the sample is conducting and if it will be outgassing in vacuum.
Please keep your samples clean (keep them in an sealed container or in Aluminium foil, do not touch them)

XPS VG S-probe

X-ray photoelectron spectroscopy
S-Probe Monochromatized XPS spectrometer Al(KR) radiation (1486 eV) as a probe,
Surface Science Instruments (VG)

Some Specific Capabilities.

Compositional Analysis: Atomic abundance of all elements (except H) on insulators, powders,metals, etc.
Chemical Analysis : Identifies bonds between specific atoms in the surface region. Polymers, oxides, etc. characterized.
Depth Profiles : Characterizes buried regions as they are exposed by ion etching.

Specifications

• Detection limits (all elements except H): ~ 0.01 monolayer, or ~ 0.1% bulk

• Measurement depth: 1 - 5 nm; area: 0.2 - 1 mm dia. (+ depth profiling with ion gun)

• Sample size: 0.1mm to 70mm dia. x 20 mm thick

• Spectrometer: Monochromatized Al(ka) Source; Vacuum ~ 5 x 10e(-10) mbar

XPS lab : 43.72
Nico De Roo : 43.69

Calendar of VG XPS
Website Department of Solid State Sciences